2024 Microscopy/Microanalysis Summer School at AMLCI/Kent-State

July 25 (Thursday)
​Online lectures

July 26 (Friday)
In-person lab demonstration and hands-on experiences
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Schedule

July 25 (online, Teams link will be sent to you)
9:30 - Background introduction of electron microscopy techniques and instruments
10:30 - DualBeam (SEM-FIB) Fundamentals for Advanced Material Characterization and Failure Analysis
​13:30 - Advanced Transistor Characterization with Transmission Electron Microscope
​15:00 - Basic application examples of electron microscopy techniques in semiconductors: structural, compositional, binding, electrical, and optical measurements, etc.
July 26 (In-person)
Demonstration schedule will be determined based on registration. Schedule and parking information will be sent to you. 
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Instructors and Topics
​We will have 4 virtual lectures. Here are the instructors and their tentative topics. ​
  • Dr. Min Gao (AMLCI, Kent State University): 1) Background introduction of electron microscopy techniques and instruments. 2) Basic application examples of electron microscopy techniques in semiconductors: structural, compositional, binding, electrical, and optical measurements, etc.  
  • Dr. Rick Passey (Sr. Manager, Product Specialists, Thermo Fisher Scientific): DualBeam (SEM-FIB) Fundamentals for Advanced Material Characterization and Failure Analysis
  • Dr. Jiong Zhang (Principal Engineer at Intel Corporation): Advanced Transistor Characterization with Transmission Electron Microscope 

In-person demonstrations at Kent State University
  • TEM/SEM (Min Gao)
  • Instruments in Anton Paar Materials Characterization Lab, including Rheometer, Viscometer, Refractometer, Raman, Polarimeter, Zeta potential, etc. (Mojtaba Rajabi) ​
Contact Min Gao ([email protected]) and Mojtaba Rajabi ([email protected]) for questions.